Education
- BA Communications, Trinity International University
- Certificate in Electron Microscopy, AA Natural Science, San Joaquin Delta College
Professional Experience and Appointments
- Forensic Engineering International, Associate
- Manager of the Nanoscale Materials Characterization Facility (NMCF) at the University of Virginia, Charlottesville, VA
- TEM manager (for Pasco Washington) at RG Lee, Monroeville, PA
- Southeast Regional Manager at EMSL Analytical overseeing five laboratories in the southeast United States.
- Laboratory Manager at EMSL Analytical, Atlanta, GA
- Laboratory Manager at Materials Analytical Services, Suwanee, GA
- Technician at Materials Analytical Services, Suwanee, GA
- Technician operating both scanning electron microscopes (SEM) and a transmission electron microscope (TEM) with Lockheed Aeronautical Systems in Marietta, GA
Instrumentation and Product Expertise
Scanning Electron Microscope (SEM)
- FEI Quanta 650 Scanning Electron Microscope
- FEI Quanta LV200 Scanning Electron Microscope
- S/TEM detector for bright-field and dark-field sample imaging
- Automated stage control, accommodates large specimens
TEM/ S-TEM (Scanning Transmission Electron Microscopy)
- FEI Titan
- 80 – 300kV S-TWIN platform
- STEM system for FEG configuration, 300 kV kit
- Resolution: STEM: 0.135 nm; TEM: 0.205 nm
- r-TEM retractable detector unit for Titan S-TWIN (0.13 Sr collection angle)
- Low-Dose Exposure Technique
- Low-Background, Double-Tilt Specimen Holder
- Old Stage, Double-Tilt Specimen Holder
- Titan Smart Tilt
- Gatan 794 Mult-scan Camera (EFTEM)
- EFTEM, EELS
- EDAX Spectroscopy
- Gatan Model 863P Tridiem GIF
- HAADF Detector
- Titan Compucentricity
- Titan Free Lens Control Operating range: 0.5 to 30 kV in 0.1 kV steps
X-Ray Diffraction (XRD)
- PANalytical X’Pert Pro MPD
- X-ray sources: Cu (λ Kα =1.54 Ã) and Cr ( λ Kα = 2.29 Ã) tubes
- Measurement range: 5- 140 deg
- Detectors: Xcelerator high-speed line detector able to measure ~2.1 deg 2θ of data simultaneously, which is roughly equivalent to 127 point detectors simultaneously collecting data.
- Proportional point detector- used mainly for thin film and texture measurements.
- Sample stages:
- Spinner,
- Multiple purpose sample stage (MPSS),
- Flat bracket,
- Eulerian cradle for thin films and texture measurements.
- Bruker Kappa Duo Single-Crystal CCD Diffractometer
- APEX II CCD detector
- X-ray sources: ceramic Mo tube and Cu Incoatec micro source
- PC computer for data collection control and structure determination
- Oxford Cryosystems 700 low-temperature device
- SHELXTL software
X-Ray Computed Tomography (XCT)
- Xradia MicroXCT-200 X-Ray Computed Tomography Instrument
- Non-destructive 3D imaging
- High spatial resolution down to <1 µm and pixel size down to 0.56 µm
- Minimal dependence of resolution on sample size
- Minimal need for sample preparation
- Easy navigation through a multiple magnification detector system
- Continuous operation through automated multiple point tomography and repetitive scanning
- Robust and low maintenance system
- High-speed reconstruction
