Professional Experience and Appointments

Instrumentation and Product Expertise

Scanning Electron Microscope (SEM)

  • FEI Quanta 650 Scanning Electron Microscope
    • In-situ analysis of diverse samples on large stage
    • Capable of ambient temperatures from -165°C to 1400°C
    • Surface imaging with optional beam deceleration
    • Characterize conductive and non-conductive samples with EDS and EBSD analysis
  • FEI Quanta LV200 Scanning Electron Microscope
    • S/TEM detector for bright-field and dark-field sample imaging
    • Automated stage control, accommodates large specimens

TEM/ S-TEM (Scanning Transmission Electron Microscopy)

  • FEI Titan
    • 80 – 300kV S-TWIN platform
    • STEM system for FEG configuration, 300 kV kit
    • Resolution: STEM: 0.135 nm; TEM: 0.205 nm
    • r-TEM retractable detector unit for Titan S-TWIN (0.13 Sr collection angle)
    • Low-Dose Exposure Technique
    • Low-Background, Double-Tilt Specimen Holder
    • Old Stage, Double-Tilt Specimen Holder
    • Titan Smart Tilt
    • Gatan 794 Mult-scan Camera (EFTEM)
    • EDAX Spectroscopy
    • Gatan Model 863P Tridiem GIF
    • HAADF Detector
    • Titan Compucentricity
    • Titan Free Lens Control Operating range: 0.5 to 30 kV in 0.1 kV steps

X-Ray Diffraction (XRD)

  • PANalytical X’Pert Pro MPD
    • X-ray sources: Cu (λ Kα =1.54 Ã) and Cr ( λ Kα = 2.29 Ã) tubes
    • Measurement range: 5- 140 deg
    • Detectors: Xcelerator high-speed line detector able to measure ~2.1 deg 2θ of data simultaneously, which is roughly equivalent to 127 point detectors simultaneously collecting data.
    • Proportional point detector- used mainly for thin film and texture measurements.
    • Sample stages:
      • Spinner,
      • Multiple purpose sample stage (MPSS),
      • Flat bracket,
      • Eulerian cradle for thin films and texture measurements.
  • Bruker Kappa Duo Single-Crystal CCD Diffractometer
    • APEX II CCD detector
    • X-ray sources: ceramic Mo tube and Cu Incoatec micro source
    • PC computer for data collection control and structure determination
    • Oxford Cryosystems 700 low-temperature device
    • SHELXTL software

X-Ray Computed Tomography (XCT)

  • Xradia MicroXCT-200 X-Ray Computed Tomography Instrument
    • Non-destructive 3D imaging
    • High spatial resolution down to <1 µm and pixel size down to 0.56 µm
    • Minimal dependence of resolution on sample size
    • Minimal need for sample preparation
    • Easy navigation through a multiple magnification detector system
    • Continuous operation through automated multiple point tomography and repetitive scanning
    • Robust and low maintenance system
    • High-speed reconstruction
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